Perovskites: The Emergence of a New Era for High-Resolving and Ultra-Sensitive Flat Panel X-Ray Detectors

The fabrication of medical and industrial X-ray imaging detectors that combine minimum fabrication costs and high performances is the major challenge since decades. Due to their strong X-ray absorption, high carrier diffusion lengths and mobility-lifetime (μτ) product hybrid inorganic-organic perovskites like Methylammonium Lead Triiodide (MAPbI3) are highly recommended as novel X-ray converting materials. Here we present a two-step manufacturing process of a microcrystalline MAPbI3 based imaging X-ray detector which decouples the fabrication of the several hundred micrometer thick absorber layer and its integration on the pixelated backplane. Microcrystalline MAPbI3 devices show an excellent sensitivity of 9300 µC/(Gyaircm²) with a μτ-product of 4E-4 cm²/V. The resulting X-ray imaging detector with 640x480 pixels, reveals a high-resolution capability of 6 line-pairs (lp)/mm simultaneous with an outstanding low detection limit of 0.22 nGyair/frame. Our findings stress the great potential of this material class for X-ray detector applications.