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Tobias Steinel

Instrument Systems

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Tobias Steinel | Instrument Systems: How significant is the accuracy improvement of live calibration compared to static methods when characterizing microLED displays with inherent spectral variations?

07:27 - 10:40

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Summary of the clip:

How significant is the accuracy improvement of live calibration compared to static methods when characterizing microLED displays with inherent spectral variations?

The efficacy of live calibration is demonstrated through measurements on a microLED display, analyzing red, green, and blue emissions. A single, rapid image capture of the entire display is performed, complemented by detailed spectral measurements at nine specific points across the display for each color. These spectrometer measurements serve as the "ground truth" due to their high precision, represented by red squares in chromaticity plots.

Comparing these ground truth values against a standard, pre-existing microLED-tailored calibration (blue points) reveals noticeable discrepancies, even for commercially available displays. However, when the live calibration method is applied, utilizing the spectral data to dynamically adjust the camera's calibration, the resulting chromaticity values (yellow crosses) align remarkably well with the spectrometer's ground truth, often within fractions of a color point. This significant reduction in error is consistently observed across red, green, and blue channels, even for systems exhibiting spectral variations of approximately four nanometers.

In this short video, you can learn:
* Experimental setup for demonstrating live calibration on a microLED display.
* Comparison of spectrometer ground truth with standard and live calibration results.
* Quantifiable accuracy improvements achieved by live calibration.
* The impact of live calibration on displays with inherent spectral shifts.

#LiveCalibration, #SpectralVariationCompensation, #ChromaticityAccuracy, #MicroLEDCharacterization, #MicroLED, #ARVRDisplays

This is a highlight of the presentation:

High accuracy optical metrology for MicroLED displays and wafers

AR/VR Connect 2025

MicroLED Connect 2025

24-25 September 2025

Conference Centre, High Tech Campus, Eindhoven, Netherlands

Organised By:

TechBlick

MicroLED Industry Association

More Highlights from the same talk.

03:37 - 04:29

How do traditional colorimeters, designed for broad-spectrum LCDs, accurately measure the spectrally diverse and narrow-band emissions of modern microLEDs?

How do traditional colorimeters, designed for broad-spectrum LCDs, accurately measure the spectrally diverse and narrow-band emissions of modern microLEDs?

Traditional display metrology, exemplified by LCDs, involved three primary stimuli (red, green, blue) that primarily differed in amplitude rather than spectral shape. This simplified the task for colorimeters, which could rely on fixed filter responses. However, the advent of OLED and particularly microLED technologies introduces a significant challenge: strong spectral variation among millions of individual emitters, often exhibiting substantial wavelength shifts and extremely narrow bandwidths.

This spectral complexity poses a critical problem for conventional tristimulus filter colorimeters. Their fixed filter responses are optimized for a standard light source, which may be entirely dissimilar to the actual device under test (DUT). Consequently, the "principle of similarity" is violated, leading to inaccurate chromaticity measurements, especially in applications like AR/VR displays and microLED wafer testing where precise spectral characterization is paramount.

In this short video, you can learn:
* The fundamental spectral differences between legacy LCDs and modern microLEDs.
* Why traditional tristimulus filter colorimeters struggle with microLEDs.
* The impact of spectral shifts and narrow bandwidths on measurement accuracy.
* The "principle of similarity" and its violation in advanced display metrology.

#TristimulusColorimeters, #MicroLEDSpectra, #NarrowBandEmissions, #PrincipleOfSimilarity, #MicroLED, #ARVRDisplays

06:02 - 07:27

Can a single measurement system achieve both the speed of a camera and the spectral accuracy of a spectrometer for microLED characterization?

Can a single measurement system achieve both the speed of a camera and the spectral accuracy of a spectrometer for microLED characterization?

To address the challenges of microLED metrology, a hybrid approach combining the speed of a camera with the precision of a spectrometer is employed. The system utilizes a camera for rapid, full-field-of-view measurements of the device under test (DUT). Crucially, a designated reference area within the field of view is simultaneously measured by both the camera and an integrated spectrometer.

The spectrometer provides the ground truth spectral data, from which highly accurate XYZ chromaticity values can be calculated without inherent error. By comparing these spectrometer-derived values to the camera's chromaticity readings for the same reference area, the system can dynamically correct or even generate a new calibration for the colorimeter. This "live calibration" ensures that the measurement device is precisely tailored to the specific spectral characteristics of the DUT, thereby maximizing accuracy and adhering to the principle of similarity.

In this short video, you can learn:
* The integration of a camera and spectrometer for display metrology.
* How a reference area enables simultaneous camera and spectrometer measurements.
* The process of calculating ground truth chromaticity from spectrometer data.
* The mechanism of "live calibration" to optimize colorimeter accuracy for the DUT.

#HybridMetrology, #CameraSpectrometer, #LiveCalibration, #SpectralGroundTruth, #MicroLED, #DisplayMetrology

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